Omicron Scanning Near Field Optical Microscope (TwinSNOM)
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Among SNOM applications is a surface topography. SNOM can measure sample surface topographical properties without touching the surface at around 100 nm scale. The images measured by SNOM are optical images that are different from images measured by AFM. This advantage can sometimes be important. For instance, the sample is composed of two identical components in shape and size, but optical properties are distinct. SNOM is capable of distinguishing the distribution of these two components in the sample. Another advantage of SNOM over AFM is measuring inner structure of samples.
Images taken from the instrument
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